XPS is an enabling technology which yields empirically quantitative information regarding the composition of compound semiconductor alloys. A study using Kratos AXIS Nova spectrometer to analyze novel ...
The Perkin Elmer PHI-660 scanning Auger microprobe can be used for the compositional analysis of specimen surfaces using Auger electron spectroscopy (AES). The probe depth of AES is on the order of ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback