The wafer probing scheduling problem (WPSP) is a variation of the parallel-machine scheduling problem, which has many real-world applications, particularly, in the integrated circuit (IC) ...
On-wafer probing techniques have become indispensable in the precise characterisation of semiconductor devices operating in the microwave and terahertz regions. These techniques enable the direct ...
FormFactor (Nasdaq: FORM) has announced BladeRunner175 (BR175), a 175-micrometer-pitch wafer probing system that increases wafer test yield and throughput for high-performance 90-nanometer flip-chip ...
Power semiconductors such as MOSFETs and IGBTs need measurements and characterization while still on the wafer—for both engineering and production. Thus, you need to probe the wafer. The TESLA200 ...
In this interview, Jeremy Hope from Wentworth Laboratories talks to AZoM about why they are attending electronica. Please tell us about the company Wentworth Labs and why you are attending electronica ...
Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...
The huge number of ICs used in today’s electronic products is difficult to comprehend, and each one has to be tested. Traditionally, testing starts at the wafer level to determine gross defects. By ...
Wafer bumps need to be uniform in height to facilitate subsequent manufacturing steps, but a push for 100% inspection in packaging in mission-critical markets is putting a strain on existing ...
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